X-ray Fluorescence Spectrometer SPECTRO Xepos P

  • Elemental Analysis
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Simultaneous energy-dispersive X-ray fluorescence spectrometer XEPOS P (AMETEK Materials Analysis Division) enables identification of elements in the Na-U range and multi-element non-destructive semi-quantitative and quantitative analysis for various types of substances with unknown matrix (except gaseous). The excitation radiation is generated by an air-cooled low-power X-ray tube with a Pd / Co anode and adapted to the specified groups of elements. The characteristic fluorescent radiation is processed by a thermoelectrically cooled SDD detector, the measuring space is flushed with helium when determining light elements. The instrument is equipped with a carousel for 12 cuvettes with a diameter of 32 mm, but it is also possible to measure large samples.

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ICP-OES spectrometer SPECTRO Arcos SOP

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ICP-OES spectrometer SPECTRO Arcos SOP
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PE 2400 Series II CHN Analyzer
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ICP-OES Spectrometer SPECTRO Arcos MultiView
System for electrothermal vaporization of samples ETV 4000c

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System for electrothermal vaporization of samples ETV 4000c